Research on the DFX Quality Control System in the Transition from R&D to Manufacturing of Wireless Communication Products
Abstract
This paper addresses the disconnect between R&D design and production implementation in modern precision electronic manufacturing, focusing on highly integrated wireless communication products. It delves into the embedded application of the DFX quality control system in the early stages of the product lifecycle. The study proposes a DFX closed-loop control model based on a risk matrix, innovatively establishing a "Design-side Risk Frontline Identification System." This system employs multi-dimensional modeling to evaluate PCB Layout density, RF shielding effectiveness, and the stability of critical component supply chains. Additionally, standardized processes and interdisciplinary decision algorithms based on Failure Mode and Effects Analysis (FMEA) are developed for RF station testing planning in complex wireless devices, as well as for resolving engineering conflicts in precision optoelectronic and electronic integrated systems. The results demonstrate that this system effectively identifies and eliminates potential electrical interference and RF compliance risks before hardware trial production, significantly reducing technical change frequency and quality failure costs. It provides theoretical foundations and practical guidance for enhancing the agility and yield rate of electronic manufacturing.
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Author Introduction: Zhao Peng Male 1978.8.16 Han Guangdong Shenzhen Undergraduate Research in Electronic and RF Engineering
DOI: http://dx.doi.org/10.26549/met.v9i1.35872
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